An inclusive test strategy looks at how the various test methods chosen will overlap to provide maximal test coverage at the lowest cost. Our robust test development offering considers all aspects of test, including:

• Turnkey automated functional test development
• System and configuration test development
• Structural test development (Optical, X-Ray and In-Circuit)
• Environmental and full lifecycle testing
• Design for test (DFT)
• Test and inspection strategy
• Fixturing
• Failure analysis
• Data management
• Test cost, quality and availability

Ayrshire Electronics can provide complete in-circuit testing with GenRad, Teradyne and Factron in-circuit testing systems. In-Circuit Test programs and fixtures may be developed and constructed in-house by Ayrshire Electronics test engineering personnel or by external partners. By utilizing a “bed-of-nails” test fixture, ICT is able to access a great percentage of the components and circuitry on an appropriately designed assembly. It can then measure discreet component values and tolerances, as well as electronically exercise and evaluate larger analog or logic components and clusters of components.

Functional testing can be accomplished using customer supplied or Ayrshire Electronics designed and built test equipment. Ayrshire Electronics Test Engineering has extensive experience in design and development of functional test equipment from simple bench top testers up to complex Automated Test Equipment (ATE) systems using National Instruments LabView as a platform. The goals of Ayrshire Electronics test development is to eliminate or minimize risk associated with component or manufacturing defects, provide diagnostic fault reporting for predictable fault analysis time, provide timely performance feedback to manufacturing processes, and to have a test system capable of use in a production environment.

• Basic test method is uncomplicated, minimal equipment/test steps, driven by operator following a written procedure, little or no fault analysis output
• PC control of Data Acquisition and Instrumentation, measuring and testing key circuit values and functionality. Comprehensive fault analysis output for technicians
• Complex test circuit UUT with one or more micros managing a complex circuit. Varying degrees of fault analysis possible
• JTAG / Boundary Scan specialized JTAG test software accessing through TAP port allows for modeled and cluster testing of non-JTAG peripheral components. Comprehensive fault analysis output for technicians